SATA-IO Testing
The SATA-IO holds multiple events every year to support and promote testing of industry products for compatibility, interoperability, and definition of new capabilities. Currently, there are two main testing events which are driven by the SATA-IO.
Plugfest:
The purpose of a Serial ATA Plugfest is to validate new designs implementing Serial ATA protocol/features & demonstrate interoperability. Target products for these events are prototypes, products still under development, and those interested in general debug with other compatible products. Benefits of the Plugfest are being able to test with many equipment vendors in a small time, to facilitate match-making, and finding areas of the spec that are unclear. For a more detailed description of how a Plugfest event works, download the Plugfest Overview presentation.
Interop Workshop (IW):
The purpose of a Serial ATA Interop Workshops is to specifically verify product interoperability and adherence to a pre-defined subset of specification requirements per the definition of SATA-IO Interoperability Testing. Target products for an IW are "market ready" products which are intended to ship "as is" into the market or are already widely available on the market. Benefits of the IW to product vendors are to provide initial opportunities for products to be tested in any newly defined areas, as well as providing a short term solution for Interop Testing with the opportunity for on-site discussion with the SATA technology experts. For a more detailed description of how an Interop Workshop event works, download the Interop Workshop Overview presentation.
Both types of week-long events are held approximately every 6 months, and are typically co-located while running in parallel during the same week. For information on when and where the next set of events are to be held, visit the SATA-IO Events Web page.
For more information on the Serial ATA Interoperability Program and Interop Workshops, visit the SATA-IO Interoperability Web page.
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